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dc.contributor.authorChiu, Shao-Chienen_US
dc.contributor.authorJhang, Jia-Sinen_US
dc.contributor.authorLin, Yen-Fuen_US
dc.contributor.authorHsu, Shih-Yingen_US
dc.contributor.authorFang, Jiyeen_US
dc.contributor.authorJian, Wen-Binen_US
dc.date.accessioned2014-12-08T15:32:08Z-
dc.date.available2014-12-08T15:32:08Z-
dc.date.issued2013en_US
dc.identifier.issn2040-3364en_US
dc.identifier.urihttp://hdl.handle.net/11536/22624-
dc.identifier.urihttp://dx.doi.org/10.1039/c3nr01418een_US
dc.description.abstractBulk nanostructured materials are made from the assembly of octahedral PbSe nanocrystals. After thermal annealing, the artificial bulk demonstrates a large difference in behavior depending on the temperature, and a large variation of room-temperature resistivity of up to seven orders of magnitude. This variation originates from the high-indexed sharp edges of the octahedral nanocrystals. As the nanocrystals are arranged in the edge-to-edge configuration, which was observed in scanning electron microscopy images, the inter-nanocrystal capacitance is small due to the small parallel area between the nanocrystals. The small capacitance results in a high thermal fluctuation voltage and drives electron transport. The temperature-dependent resistivity and the electric field-dependent current are highly in agreement with the model of fluctuation-induced tunneling conduction. Thermal annealing reduces the inter-nanocrystal separation distance, creating a large variation in the electrical properties. Specifically, octahedral-shaped PbSe nanocrystals are employed in tailoring the electron transport in bulk nanostructured materials.en_US
dc.language.isoen_USen_US
dc.titleNanocrystal shape and nanojunction effects on electron transport in nanocrystal-assembled bulksen_US
dc.typeArticleen_US
dc.identifier.doi10.1039/c3nr01418een_US
dc.identifier.journalNANOSCALEen_US
dc.citation.volume5en_US
dc.citation.issue18en_US
dc.citation.spage8555en_US
dc.citation.epage8559en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000323521000033-
dc.citation.woscount0-
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