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dc.contributor.authorSeto, Keisukeen_US
dc.contributor.authorOkuda, Yoshinaoen_US
dc.contributor.authorTokunaga, Eijien_US
dc.contributor.authorKobayashi, Takayoshien_US
dc.date.accessioned2014-12-08T15:32:35Z-
dc.date.available2014-12-08T15:32:35Z-
dc.date.issued2013-08-01en_US
dc.identifier.issn0034-6748en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4818670en_US
dc.identifier.urihttp://hdl.handle.net/11536/22801-
dc.description.abstractWe report the development of a multiplex stimulated Raman microscope for spectral imaging through multi-channel lock-in detection with a single light source. A white pump beam is prepared with a piece of photonic crystal fiber (PCF). The system does not require the synchronization of plural light sources or the scanning of their wavelengths, and thus a jitter-free pair of pump and Stokes beams is obtained, and a high degree of temporal synchronization is attained in the spectra. The multichannel lock-in detection (extended to 128 channels) enables the observation of pseudo-continuous stimulated Raman spectra, demonstrating the strong ability of qualitative analysis to identify various types of C-H stretching modes such as the symmetric and asymmetric modes of the methylene/methyl and aromatic groups. Images of a mixed film of polystyrene and polymethylmethacrylate are presented to demonstrate the system's spectral imaging ability. The spatial distribution of these materials is successfully captured through one-time imaging, although the noise of the white light pump beam generated with the PCF limits the system's imaging speed. (C) 2013 AIP Publishing LLC.en_US
dc.language.isoen_USen_US
dc.titleDevelopment of a multiplex stimulated Raman microscope for spectral imaging through multi-channel lock-in detectionen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.4818670en_US
dc.identifier.journalREVIEW OF SCIENTIFIC INSTRUMENTSen_US
dc.citation.volume84en_US
dc.citation.issue8en_US
dc.citation.epageen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000323947400027-
dc.citation.woscount3-
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