標題: | Overview of the Gas and Aerosol Metrology |
作者: | Tsai, C. J. Aggarwal, S. G. 環境工程研究所 Institute of Environmental Engineering |
關鍵字: | Gas and aerosol metrology;Calibration standards;Traceability;Nanoparticle measurement;Air quality and vehicular emission regulations |
公開日期: | 1-Sep-2013 |
摘要: | There are several exciting developments noted in gas and aerosol measurements in recent years. On the other hand not much work has been done on the calibration facility, traceable standards, and certified reference materials for this field of science. More attention and concerns are needed for the comparable and SI traceable data quality in gas and aerosol measurements. The aim of this special issue of MAPAN-Journal of Metrology Society of India is to highlight such issues. |
URI: | http://dx.doi.org/10.1007/s12647-013-0075-8 http://hdl.handle.net/11536/23032 |
ISSN: | 0970-3950 |
DOI: | 10.1007/s12647-013-0075-8 |
期刊: | MAPAN-JOURNAL OF METROLOGY SOCIETY OF INDIA |
Volume: | 28 |
Issue: | 3 |
起始頁: | 141 |
結束頁: | 143 |
Appears in Collections: | Articles |
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