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dc.contributor.authorLee, Chih-Haoen_US
dc.contributor.authorLiang, Keng S.en_US
dc.contributor.authorChern, M. Y.en_US
dc.date.accessioned2014-12-08T15:33:16Z-
dc.date.available2014-12-08T15:33:16Z-
dc.date.issued2013-07-01en_US
dc.identifier.issn0009-4536en_US
dc.identifier.urihttp://dx.doi.org/10.1002/jccs.201200602en_US
dc.identifier.urihttp://hdl.handle.net/11536/23156-
dc.description.abstractX-ray measurements (specular and off-specular X-ray reflectivity, in-plane and plane-normal diffraction and truncation rod measurement) were carried out to characterize the epitaxial magnetic multilayers of yttrium iron garnet/gadolinium gallium garnet(GGG) on GGG substrate grown by the laser ablation deposition method. The perfection of the multilayer epitaxy can be better revealed in the observation of the 2(nd) harmonics of superlattice peaks in the reflectivity measurement, the forbidden diffraction peaks and the truncation rod measurement.en_US
dc.language.isoen_USen_US
dc.subjectX-ray surface scatteringen_US
dc.subjectSuperlatticeen_US
dc.subjectYttrium iron garnet thin filmen_US
dc.titleThe Structures of Yttrium Iron Garnet/Gadolinium Gallium Garnet Superlattice Thin Films Studied by Synchrotron X-Ray Surface Scatteringen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/jccs.201200602en_US
dc.identifier.journalJOURNAL OF THE CHINESE CHEMICAL SOCIETYen_US
dc.citation.volume60en_US
dc.citation.issue7en_US
dc.citation.spage870en_US
dc.citation.epage876en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000327695600026-
dc.citation.woscount0-
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