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dc.contributor.authorChang, Kow-Mingen_US
dc.contributor.authorHo, Po-Chingen_US
dc.contributor.authorAriyarit, Atthapornen_US
dc.contributor.authorYang, Kuo-Huien_US
dc.contributor.authorHsu, Jui-Meien_US
dc.contributor.authorWu, Chin-Jyien_US
dc.contributor.authorChang, Chia-Chiangen_US
dc.date.accessioned2014-12-08T15:33:23Z-
dc.date.available2014-12-08T15:33:23Z-
dc.date.issued2013-12-02en_US
dc.identifier.issn0040-6090en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.tsf.2013.09.082en_US
dc.identifier.urihttp://hdl.handle.net/11536/23207-
dc.description.abstractTo enhance the light-trapping qualities of silicon thin-film solar cells, the use of transparent conductive oxide with high haze and high conductivity is essential. This study investigated an eco-friendly technique that used bilayer Ga-doped zinc oxide/SiOx films prepared with an atmospheric pressure plasma jet to achieve high haze and low resistivity. A minimum resistivity of 6.00 x 10(-4) Omega.cm was achieved at 8 at.% gallium doping. Examination of X-ray diffraction spectra showed that increased film thickness led to increased carrier concentration in GZO bilayers. The optimal bilayer GZO film achieved considerably higher haze values in the visible and NIR regions, compared with Asahi U-type fluorine doped tin oxide. (C) 2013 Elsevier B. V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectTransparent conductive oxideen_US
dc.subjectLight-trapping effecten_US
dc.subjectAtmospheric pressure plasmaen_US
dc.titleEnhancement of the light-scattering ability of Ga-doped ZnO thin films using SiOx nano-films prepared by atmospheric pressure plasma deposition systemen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.tsf.2013.09.082en_US
dc.identifier.journalTHIN SOLID FILMSen_US
dc.citation.volume548en_US
dc.citation.issueen_US
dc.citation.spage460en_US
dc.citation.epage464en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000327530300075-
dc.citation.woscount4-
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