標題: Lens sag and diameter measurement of large-size microlenses using sub-pixel algorithm and optical interferometry
作者: Lin, Shir-Kuan
Yang, Shih-Wei
電控工程研究所
Institute of Electrical and Control Engineering
關鍵字: Diameter;Lens sag;Large-size microlens
公開日期: 1-Apr-2014
摘要: In this paper, an automatic optical inspection system is designed specifically to measure the diameter and lens sag of large-size microlenses: 1. The proposed algorithm of measuring lens diameter locates the lens center through the Euclidean distance array, and determines the lens edge along an initiated ray using linear interpolation with sub-pixel accuracy. 2. The lens sag is calculated from a single fringe pattern of large-size microlens, in combination with the measured lens diameter. 3. According to the experiment results, the proposed system has advantages of high applicability, rapid processing speed, and good accuracy with the RMS error <=% of measuring a large-size microlens, but without the requirement of prior training. The system architecture of non-contact measurement would not cause scratches on the lens surface and is inexpensive, this, which is particularly suitable for the in-line inspection of industry field. (C) 2013 Elsevier Ltd. All rights reserved.
URI: http://dx.doi.org/10.1016/j.optlastec.2013.06.002
http://hdl.handle.net/11536/23364
ISSN: 0030-3992
DOI: 10.1016/j.optlastec.2013.06.002
期刊: OPTICS AND LASER TECHNOLOGY
Volume: 57
Issue: 
起始頁: 293
結束頁: 303
Appears in Collections:Articles


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