標題: | Lens sag and diameter measurement of large-size microlenses using sub-pixel algorithm and optical interferometry |
作者: | Lin, Shir-Kuan Yang, Shih-Wei 電控工程研究所 Institute of Electrical and Control Engineering |
關鍵字: | Diameter;Lens sag;Large-size microlens |
公開日期: | 1-四月-2014 |
摘要: | In this paper, an automatic optical inspection system is designed specifically to measure the diameter and lens sag of large-size microlenses: 1. The proposed algorithm of measuring lens diameter locates the lens center through the Euclidean distance array, and determines the lens edge along an initiated ray using linear interpolation with sub-pixel accuracy. 2. The lens sag is calculated from a single fringe pattern of large-size microlens, in combination with the measured lens diameter. 3. According to the experiment results, the proposed system has advantages of high applicability, rapid processing speed, and good accuracy with the RMS error <=% of measuring a large-size microlens, but without the requirement of prior training. The system architecture of non-contact measurement would not cause scratches on the lens surface and is inexpensive, this, which is particularly suitable for the in-line inspection of industry field. (C) 2013 Elsevier Ltd. All rights reserved. |
URI: | http://dx.doi.org/10.1016/j.optlastec.2013.06.002 http://hdl.handle.net/11536/23364 |
ISSN: | 0030-3992 |
DOI: | 10.1016/j.optlastec.2013.06.002 |
期刊: | OPTICS AND LASER TECHNOLOGY |
Volume: | 57 |
Issue: | |
起始頁: | 293 |
結束頁: | 303 |
顯示於類別: | 期刊論文 |