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dc.contributor.authorChao, YFen_US
dc.contributor.authorLee, KYen_US
dc.date.accessioned2014-12-08T15:34:17Z-
dc.date.available2014-12-08T15:34:17Z-
dc.date.issued2005-02-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.44.1111en_US
dc.identifier.urihttp://hdl.handle.net/11536/23489-
dc.description.abstractA simple three-intensity imaging ellipsometric technique is proposed for measurement of the refractive index profile (RIP) of a radial gradient index (GRIN) lens. According to our numerical analysis, the improved ellipsometric parameters measured by this method are valid as long as the azimuth deviation of the polarizer is less than 3 degrees. A BK7 glass and a radial GRIN lens were measured. A fairly flat refractive index surface profile was obtained for the glass within a 0.3% error. The on-axis refractive index of the radial GRIN lens and its RIP are well fitted to the specifications provided by the manufacturer. Instead of the refracted-ray method, we provide a reflective and nondestructive measurement technique for measurement of the gradient index of a flat surface.en_US
dc.language.isoen_USen_US
dc.subjectellipsometryen_US
dc.subjectimagingen_US
dc.subjectrefractive index profileen_US
dc.subjectgradient index lensen_US
dc.titleIndex profile of radial gradient index lens measured by imaging ellipsometric techniqueen_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.44.1111en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERSen_US
dc.citation.volume44en_US
dc.citation.issue2en_US
dc.citation.spage1111en_US
dc.citation.epage1114en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000227675300067-
dc.citation.woscount13-
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