標題: Index profile of radial gradient index lens measured by imaging ellipsometric technique
作者: Chao, YF
Lee, KY
光電工程學系
Department of Photonics
關鍵字: ellipsometry;imaging;refractive index profile;gradient index lens
公開日期: 1-二月-2005
摘要: A simple three-intensity imaging ellipsometric technique is proposed for measurement of the refractive index profile (RIP) of a radial gradient index (GRIN) lens. According to our numerical analysis, the improved ellipsometric parameters measured by this method are valid as long as the azimuth deviation of the polarizer is less than 3 degrees. A BK7 glass and a radial GRIN lens were measured. A fairly flat refractive index surface profile was obtained for the glass within a 0.3% error. The on-axis refractive index of the radial GRIN lens and its RIP are well fitted to the specifications provided by the manufacturer. Instead of the refracted-ray method, we provide a reflective and nondestructive measurement technique for measurement of the gradient index of a flat surface.
URI: http://dx.doi.org/10.1143/JJAP.44.1111
http://hdl.handle.net/11536/23489
ISSN: 0021-4922
DOI: 10.1143/JJAP.44.1111
期刊: JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS
Volume: 44
Issue: 2
起始頁: 1111
結束頁: 1114
顯示於類別:期刊論文


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