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dc.contributor.authorChou, Y. -C.en_US
dc.contributor.authorHillerich, K.en_US
dc.contributor.authorTersoff, J.en_US
dc.contributor.authorReuter, M. C.en_US
dc.contributor.authorDick, K. A.en_US
dc.contributor.authorRoss, F. M.en_US
dc.date.accessioned2014-12-08T15:34:32Z-
dc.date.available2014-12-08T15:34:32Z-
dc.date.issued2014-01-17en_US
dc.identifier.issn0036-8075en_US
dc.identifier.urihttp://dx.doi.org/10.1126/science.1244623en_US
dc.identifier.urihttp://hdl.handle.net/11536/23592-
dc.description.abstractIn the growth of nanoscale device structures, the ultimate goal is atomic-level precision. By growing III-V nanowires in a transmission electron microscope, we measured the local kinetics in situ as each atomic plane was added at the catalyst-nanowire growth interface by the vapor-liquid-solid process. During growth of gallium phosphide nanowires at typical V/III ratios, we found surprising fluctuations in growth rate, even under steady growth conditions. We correlated these fluctuations with the formation of twin defects in the nanowire, and found that these variations can be suppressed by switching to growth conditions with a low V/III ratio. We derive a growth model showing that this unexpected variation in local growth kinetics reflects the very different supply pathways of the V and III species. The model explains under which conditions the growth rate can be controlled precisely at the atomic level.en_US
dc.language.isoen_USen_US
dc.titleAtomic-Scale Variability and Control of III-V Nanowire Growth Kineticsen_US
dc.typeArticleen_US
dc.identifier.doi10.1126/science.1244623en_US
dc.identifier.journalSCIENCEen_US
dc.citation.volume343en_US
dc.citation.issue6168en_US
dc.citation.spage281en_US
dc.citation.epage284en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000329718600031-
dc.citation.woscount7-
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