完整後設資料紀錄
DC 欄位語言
dc.contributor.authorChen, Yu-Chungen_US
dc.contributor.authorLin, Bo-Wenen_US
dc.contributor.authorHsu, Wen-Chingen_US
dc.contributor.authorWu, YewChung Sermonen_US
dc.date.accessioned2014-12-08T15:34:56Z-
dc.date.available2014-12-08T15:34:56Z-
dc.date.issued2014-03-01en_US
dc.identifier.issn0167-577Xen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.matlet.2013.12.035en_US
dc.identifier.urihttp://hdl.handle.net/11536/23762-
dc.description.abstractA wet etching process was employed to investigate the evolution of pyramids on the patterned sapphire substrate (PSS). It has been found that the PSS comprised a hexagonal pyramid covered with six facets {3 (4) over bar 1 7} when disk-shaped SiO2 mask still remained. Three facets {1 (1) over bar 0 5} were exposed when mask was etched away. In this study, a continuous etching process was performed. It was found that another six facets {4 (5) over bar 1 30} and another three facets {1 (1) over bar 0 10} appeared on the bottom and the top of pyramid. Finally, when the etching time reached around 5 min, most of pyramids on the PSS disappeared. (C) 2013 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectPatterned sapphire substrateen_US
dc.subjectWet etching processen_US
dc.subjectCrystal structureen_US
dc.subjectOptical materialsen_US
dc.subjectPropertiesen_US
dc.subjectSurfacesen_US
dc.titleMorphologies and plane indices of pyramid patterns on wet-etched patterned sapphire substrateen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.matlet.2013.12.035en_US
dc.identifier.journalMATERIALS LETTERSen_US
dc.citation.volume118en_US
dc.citation.issueen_US
dc.citation.spage72en_US
dc.citation.epage75en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000331666600020-
dc.citation.woscount0-
顯示於類別:期刊論文


文件中的檔案:

  1. 000331666600020.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。