標題: | Locating Damage Using Integrated Global-Local Approach with Wireless Sensing System and Single-Chip Impedance Measurement Device |
作者: | Lin, Tzu-Hsuan Lu, Yung-Chi Hung, Shih-Lin 土木工程學系 Department of Civil Engineering |
公開日期: | 2014 |
摘要: | This study developed an integrated global-local approach for locating damage on building structures. A damage detection approach with a novel embedded frequency response function damage index (NEFDI) was proposed and embedded in the Imote2.NET-based wireless structural health monitoring (SHM) system to locate global damage. Local damage is then identified using an electromechanical impedance-(EMI-) based damage detection method. The electromechanical impedance was measured using a single-chip impedance measurement device which has the advantages of small size, low cost, and portability. The feasibility of the proposed damage detection scheme was studied with reference to a numerical example of a six-storey shear plane frame structure and a small-scale experimental steel frame. Numerical and experimental analysis using the integrated global-local SHM approach reveals that, after NEFDI indicates the approximate location of a damaged area, the EMI-based damage detection approach can then identify the detailed damage location in the structure of the building. |
URI: | http://hdl.handle.net/11536/23860 http://dx.doi.org/10.1155/2014/729027 |
ISSN: | 1537-744X |
DOI: | 10.1155/2014/729027 |
期刊: | SCIENTIFIC WORLD JOURNAL |
顯示於類別: | 期刊論文 |