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dc.contributor.authorKumar, S.en_US
dc.contributor.authorZallo, E.en_US
dc.contributor.authorLiao, Y. H.en_US
dc.contributor.authorLin, P. Y.en_US
dc.contributor.authorTrotta, R.en_US
dc.contributor.authorAtkinson, P.en_US
dc.contributor.authorPlumhof, J. D.en_US
dc.contributor.authorDing, F.en_US
dc.contributor.authorGerardot, B. D.en_US
dc.contributor.authorCheng, S. J.en_US
dc.contributor.authorRastelli, A.en_US
dc.contributor.authorSchmidt, O. G.en_US
dc.date.accessioned2019-04-03T06:43:54Z-
dc.date.available2019-04-03T06:43:54Z-
dc.date.issued2014-03-12en_US
dc.identifier.issn1098-0121en_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.89.115309en_US
dc.identifier.urihttp://hdl.handle.net/11536/23982-
dc.description.abstractWe study the effects of heavy hole-light hole (HH-LH) mixing on fine-structure and polarization properties of neutral excitons ( X-0) confined in single GaAs/AlGaAs quantum dots (QDs) under the application of anisotropic biaxial stress. In the large HH-LH mixing regime, these properties are substantially different from the usually observed properties in the case of small or no mixing. By varying the applied stress, the mixing in the initially strain-free QDs changes from similar to 0 to similar to 70% and an anomalous anticrossing of the X-0 bright states is observed. The latter is attributed to stress-induced rotation of the in-plane principal axis of the QD confinement potential. We show that the analysis of free-excitonic emission of bulk GaAs surrounding the QDs not only allows estimation of the stress and mixing in the QDs, but also provides the quantum-confinement-induced HH-LH splitting of the as-grown QDs.en_US
dc.language.isoen_USen_US
dc.titleAnomalous anticrossing of neutral exciton states in GaAs/AlGaAs quantum dotsen_US
dc.typeArticleen_US
dc.identifier.doi10.1103/PhysRevB.89.115309en_US
dc.identifier.journalPHYSICAL REVIEW Ben_US
dc.citation.volume89en_US
dc.citation.issue11en_US
dc.citation.spage0en_US
dc.citation.epage0en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000332630300002en_US
dc.citation.woscount12en_US
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