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dc.contributor.authorLee, YJen_US
dc.contributor.authorHuang, JMen_US
dc.contributor.authorKuo, SWen_US
dc.contributor.authorLu, JSen_US
dc.contributor.authorChang, FCen_US
dc.date.accessioned2014-12-08T15:35:51Z-
dc.date.available2014-12-08T15:35:51Z-
dc.date.issued2005-01-06en_US
dc.identifier.issn0032-3861en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.polymer.2004.10.003en_US
dc.identifier.urihttp://hdl.handle.net/11536/24238-
dc.description.abstractA novel polyimide (PI) hybrid nanocomposite containing polyhedral oligomeric silsesquioxane (POSS) with well defined architecture has been prepared by copolymerization of octakis(glycidyldimethylsiloxy)octasilsesquioxane (Epoxy-POSS), 4,4'-oxydianiline diamine (ODA), and 4,4'-carbonyldiphthalic anhydride (BTDA). In these nanocomposite materials, the equivalent ratio of the Epoxy-POSS and ODA are adjustable, and the resultant PI-POSS nanocomposites give variable thermal and mechanical properties. More importantly, we intend to explore the possibility of incorporating POSS moiety through the Epoxy-POSS into the polyimide network to achieve the polyimide hybrid with lower dielectric constant (low-k) and thermal expansion. The lowest dielectric constant achieved of the POSS/PI material (PI-10P) is 2.65 by incorporating 10 wt% Epoxy-POSS (pure PI, k = 3.22). In addition, when contents of the POSS in the hybrids are 0, 3, 10 wt% (PI-0P, PI-3P, PI-10P), and the resultant thermal expansion coefficients (TEC) are 66.23, 63.28, and 58.25 ppm/degreesC, respectively. The reduction in the dielectric constants and the resultant thermal expansion coefficients of the PI-POSS hybrids can be explained in terms of creating silsesquioxane cores of the POSS and the free volume increase by the presence of the POSS-tethers network resulting in a loose PI structure. (C) 2004 Elsevier Ltd. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectpolyimideen_US
dc.subjectPOSSen_US
dc.subjectlow-ken_US
dc.titlePolyimide and polyhedral oligomeric silsesquioxane nanocomposites for low-dielectric applicationsen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.polymer.2004.10.003en_US
dc.identifier.journalPOLYMERen_US
dc.citation.volume46en_US
dc.citation.issue1en_US
dc.citation.spage173en_US
dc.citation.epage181en_US
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.identifier.wosnumberWOS:000226316700019-
dc.citation.woscount95-
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