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dc.contributor.authorHuang, Yen-Tangen_US
dc.contributor.authorHsu, Hung-Jungen_US
dc.contributor.authorLiang, Shin-Weien_US
dc.contributor.authorHsu, Cheng-Hangen_US
dc.contributor.authorTsai, Chuang-Chuangen_US
dc.date.accessioned2014-12-08T15:36:37Z-
dc.date.available2014-12-08T15:36:37Z-
dc.date.issued2014en_US
dc.identifier.issn1110-662Xen_US
dc.identifier.urihttp://hdl.handle.net/11536/24954-
dc.identifier.urihttp://dx.doi.org/10.1155/2014/579176en_US
dc.description.abstractHydrogenated microcrystalline silicon-germanium (mu c-Si1-xGex:H) alloys were developed for application in Si-based thin-film solar cells. The effects of the germane concentration (R-GeH4) and the hydrogen ratio (R-H2) on the mu c-Si1-xGex:H alloys and the corresponding single-junction thin-film solar cells were studied. The behaviors of Ge incorporation in a-Si1-xGex:H and mu c-Si1-xGex:H were also compared. Similar to a-Si1-xGex:H, the preferential Ge incorporation was observed in mu c-Si1-xGex:H. Moreover, a higher R-H2 significantly promoted Ge incorporation for a-Si1-xGex: H, while the Ge content was not affected by R-H2 in mu c-Si1-xGex:H growth. Furthermore, to eliminate the crystallization effect, the 0.9 mu m thick absorbers with a similar crystalline volume fraction were applied. With the increasing R-GeH4, the accompanied increase in Ge content of mu c-Si1-xGex:H narrowed the bandgap and markedly enhanced the long-wavelength absorption. However, the bias-dependent EQE measurement revealed that too much Ge incorporation in absorber deteriorated carrier collection and cell performance. With the optimization of R-H2 and R-GeH4, the single-junction mu c-Si1-xGex:H cell achieved an efficiency of 5.48%, corresponding to the crystalline volume fraction of 50.5% and Ge content of 13.2 at.%. Compared to mu c-Si:H cell, the external quantum efficiency at 800nm had a relative increase by 33.1%.en_US
dc.language.isoen_USen_US
dc.titleDevelopment of Hydrogenated Microcrystalline Silicon-Germanium Alloys for Improving Long-Wavelength Absorption in Si-Based Thin-Film Solar Cellsen_US
dc.typeArticleen_US
dc.identifier.doi10.1155/2014/579176en_US
dc.identifier.journalINTERNATIONAL JOURNAL OF PHOTOENERGYen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000340188000001-
dc.citation.woscount0-
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