完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Zhang, G. -Y. | en_US |
dc.contributor.author | Zhang, H. | en_US |
dc.contributor.author | Tan, S. -L. | en_US |
dc.contributor.author | Zhang, P. -X. | en_US |
dc.contributor.author | Tseng, T. -Y. | en_US |
dc.contributor.author | Habermeier, H. -U. | en_US |
dc.contributor.author | Lin, C. -T. | en_US |
dc.contributor.author | Singjai, P. | en_US |
dc.date.accessioned | 2014-12-08T15:36:41Z | - |
dc.date.available | 2014-12-08T15:36:41Z | - |
dc.date.issued | 2014-09-01 | en_US |
dc.identifier.issn | 0947-8396 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1007/s00339-014-8335-1 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/25032 | - |
dc.description.abstract | Strongly correlated electronic (SCE) materials including high-temperature superconducting cuprate and colossal magnetoresistance manganite thin films demonstrate tremendous anisotropic Seebeck effect which makes them very promising for developing high-performance laser detectors. In this work, laser-induced thermoelectric voltage (LITV) signals with nanosecond response time have been measured in SCE La1-xPbxMnO3 thin films based on anisotropic Seebeck effect at room temperature. The magnitude of the LITV signals increases linearly with laser energy/power density in a wide range of laser wavelengths from ultraviolet, visible to infrared based on which a novel SCE thin-film laser energy/power meter has been developed. | en_US |
dc.language.iso | en_US | en_US |
dc.title | A novel strongly correlated electronic thin-film laser energy/power meter based on anisotropic Seebeck effect | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1007/s00339-014-8335-1 | en_US |
dc.identifier.journal | APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | en_US |
dc.citation.volume | 116 | en_US |
dc.citation.issue | 3 | en_US |
dc.citation.spage | 1033 | en_US |
dc.citation.epage | 1039 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
顯示於類別: | 期刊論文 |