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dc.contributor.authorLe, Phuoc Huuen_US
dc.contributor.authorTzeng, Wen-Yenen_US
dc.contributor.authorChen, Hsueh-Juen_US
dc.contributor.authorLuo, Chih Weien_US
dc.contributor.authorLin, Jiunn-Yuanen_US
dc.contributor.authorLeu, Jihperngen_US
dc.date.accessioned2014-12-08T15:36:48Z-
dc.date.available2014-12-08T15:36:48Z-
dc.date.issued2014-09-01en_US
dc.identifier.issn2166-532Xen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4894779en_US
dc.identifier.urihttp://hdl.handle.net/11536/25186-
dc.description.abstractWe report superconductivity at an onset critical temperature below 3.1 K in topological insulator similar to 200-nm-thick Bi2Te3 thin films grown by pulsed laser deposition. Using energy-dispersive X-ray spectroscopy elemental mapping and Auger electron spectroscopy elemental depth profiling, we clearly identified bismuth (Bi) precipitation and Bi cluster signatures. Superconductivity in the Bi2Te3 films was attributed to the proximity effect of Bi clusters precipitated on the surface of the Bi2Te3 films. (C) 2014 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.en_US
dc.language.isoen_USen_US
dc.titleSuperconductivity in textured Bi clusters/Bi2Te3 filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.4894779en_US
dc.identifier.journalAPL MATERIALSen_US
dc.citation.volume2en_US
dc.citation.issue9en_US
dc.citation.epageen_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department電子物理學系zh_TW
dc.contributor.department物理研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentInstitute of Physicsen_US
dc.identifier.wosnumberWOS:000342568000027-
dc.citation.woscount0-
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