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dc.contributor.authorCHYAN, YFen_US
dc.contributor.authorSZE, SMen_US
dc.contributor.authorCHANG, CYen_US
dc.contributor.authorLIAO, Ken_US
dc.contributor.authorREIF, Ren_US
dc.date.accessioned2014-12-08T15:04:01Z-
dc.date.available2014-12-08T15:04:01Z-
dc.date.issued1994-05-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.33.2619en_US
dc.identifier.urihttp://hdl.handle.net/11536/2518-
dc.description.abstractWe present a systematic study of the temperature influence on the generalized Einstein relation for degenerate semiconductors with different band structures. The conventional Einstein relation is still a good approximation at very high temperatures for most carrier concentrations but becomes invalid at low temperatures for highly degenerate semiconductors. As the temperature rises, higher energy bands with small minimum energy separations (e.g., from GAMMA band to L band) and large density-of-state effective masses will have a larger fraction of carriers, because the minimum energy separations become comparable to the thermal energy. Thus, from 500 K to 1200 K, in n-type GaAs and n-type Ge, we observe kinks in the D/mu versus carrier concentration curves. However, no such kinks are observed in n-type Si due to its large minimum energy separations. Similarly, p-type Ge and p-type GaAs show no kinks, because the energy of the spin-orbit splitting in these semiconductors is large compared to the thermal energy.en_US
dc.language.isoen_USen_US
dc.subjectEINSTEIN RELATIONen_US
dc.subjectDEGENERATEen_US
dc.subjectBAND STRUCTUREen_US
dc.subjectKINKen_US
dc.subjectTHERMAL ENERGYen_US
dc.titleTEMPERATURE INFLUENCE ON THE GENERALIZED EINSTEIN RELATION FOR DEGENERATE SEMICONDUCTORS WITH ARBITRARY BAND STRUCTURESen_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.33.2619en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERSen_US
dc.citation.volume33en_US
dc.citation.issue5Aen_US
dc.citation.spage2619en_US
dc.citation.epage2625en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1994NU12600035-
dc.citation.woscount0-
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