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dc.contributor.authorYang, TYen_US
dc.contributor.authorTong, LIen_US
dc.contributor.authorYuan, BJCen_US
dc.date.accessioned2014-12-08T15:37:08Z-
dc.date.available2014-12-08T15:37:08Z-
dc.date.issued2005en_US
dc.identifier.issn0267-5730en_US
dc.identifier.urihttp://hdl.handle.net/11536/25523-
dc.identifier.urihttp://dx.doi.org/10.1504/IJTM.2005.006349en_US
dc.description.abstractThe cost of masks is rising rapidly as semiconductor manufacturing technology advances. This increase in cost is a major issue in the development of new products. This study focuses mainly on the business demands of semiconductor design companies who verify the prototypes and produce small-volume wafers, and analyses the constraints on the current Multi-Project Wafer (MPW) model. A new MPW model is proposed to reduce the mask cost and the unit die cost simultaneously. The proposed MPW model allows customers to find the optimal solution to the mask cost and unit die cost according to the chip size and the number of dice required. This study also compares the current model with the proposed MPW model using 0.13 um technology, as an example. For a purchased quantity of dice from a few thousand to less than a hundred thousand, the proposed MPW model yields the lowest sum of the mask cost and the dice cost. Since this ran-e of dice quantities covers more than half of the dice required for semiconductor products, the proposed MPW model can help the semiconductor industry to resolve the conflict between the mask cost and the unit die cost that is caused by the constraints on the current MPW model. When the technology advances to the 90 nm generation, and requested die quantities increased to more than 100,000, the small-volume MPW model proposed in this study will still yield the lowest mask cost and total dice cost.en_US
dc.language.isoen_USen_US
dc.subjectmulti-project wafer modelen_US
dc.subjectprototyping verificationen_US
dc.subjectsmall-volume productionen_US
dc.titleAn innovative model of multi-project wafer service in the foundry industryen_US
dc.typeArticleen_US
dc.identifier.doi10.1504/IJTM.2005.006349en_US
dc.identifier.journalINTERNATIONAL JOURNAL OF TECHNOLOGY MANAGEMENTen_US
dc.citation.volume30en_US
dc.citation.issue1-2en_US
dc.citation.spage172en_US
dc.citation.epage187en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.department科技管理研究所zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.contributor.departmentInstitute of Management of Technologyen_US
dc.identifier.wosnumberWOS:000228167700010-
dc.citation.woscount3-
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