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dc.contributor.authorChau, YFen_US
dc.contributor.authorYang, TJen_US
dc.contributor.authorTsai, DPen_US
dc.date.accessioned2014-12-08T15:37:14Z-
dc.date.available2014-12-08T15:37:14Z-
dc.date.issued2004-12-01en_US
dc.identifier.issn0021-4922en_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.43.8115en_US
dc.identifier.urihttp://hdl.handle.net/11536/25580-
dc.description.abstractA series of finite difference time domain (FDTD) methods for obtaining more insight on the near-field distribution of subwavelength aperture and fiber probes are numerically investigated. The treatment of dispersive materials in a time-domain-dependent fashion is considered. Several significant factors are also considered successively, e.g., the near-field distribution of subwavelength aperture in an infinite aluminum plane with sample interactions, the characteristics between the near-field distribution and the depolarization phenomenon, different types of three-dimensional tip (noncoated and metal-coated) used to illuminate a photosensitive sample and the polarization of an incident electromagnetic field. Moreover, the FDTD designs of two types of improved probe are illustrated and a suggestion for fabricating an optimal probe is given. Our proposed structures will yield useful information and guidelines for designing high-performance near-field probes.en_US
dc.language.isoen_USen_US
dc.subjectFDTDen_US
dc.subjectnear fielden_US
dc.subjectdispersive materialsen_US
dc.subjectdepolarizationen_US
dc.subjectNSOMen_US
dc.subjectfiber probesen_US
dc.subjectsubwavelengthen_US
dc.titleImaging properties of three dimensional aperture near-field scanning optical microscopy and optimized near-field fiber probe designsen_US
dc.typeArticleen_US
dc.identifier.doi10.1143/JJAP.43.8115en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERSen_US
dc.citation.volume43en_US
dc.citation.issue12en_US
dc.citation.spage8115en_US
dc.citation.epage8125en_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000226035000042-
dc.citation.woscount8-
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