完整後設資料紀錄
DC 欄位語言
dc.contributor.authorCHENG, TMen_US
dc.contributor.authorCHIN, Aen_US
dc.contributor.authorCHANG, CYen_US
dc.contributor.authorHUANG, MFen_US
dc.contributor.authorHSIEH, KYen_US
dc.contributor.authorHUANG, JHen_US
dc.date.accessioned2014-12-08T15:04:04Z-
dc.date.available2014-12-08T15:04:04Z-
dc.date.issued1994-03-21en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.111861en_US
dc.identifier.urihttp://hdl.handle.net/11536/2577-
dc.description.abstractLow temperature InGaAs strained quantum wells have been grown by molecular beam epitaxy and annealed at 600-900-degrees-C for 10 min. For an optimized annealing condition, arsenic precipitates can be successfully confined in the InGaAs wells and completely depleted in the GaAs barriers. The strong accumulation of As precipitates shows that the phenomena are not due to the strain effect but may be explained by the difference of interfacial energy between precipitate and matrix. The ability to control the As precipitates into two-dimensional quantum wells in LT materials has unique applications in a wide variety of devices.en_US
dc.language.isoen_USen_US
dc.titleSTRONG ACCUMULATION OF AS PRECIPITATES IN LOW-TEMPERATURE INGAAS QUANTUM-WELLS GROWN BY MOLECULAR-BEAM EPITAXYen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.111861en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.citation.volume64en_US
dc.citation.issue12en_US
dc.citation.spage1546en_US
dc.citation.epage1548en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:A1994NB63900029-
dc.citation.woscount24-
顯示於類別:期刊論文