標題: SU-8 serial MEMS switch for flexible RF applications
作者: Chao, Tzu-Yuan
Hsu, M. C.
Lin, C-D
Cheng, Y. T.
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
公開日期: 1-二月-2011
摘要: This paper presents a novel SU-8 micromachining process for MEMS series switch fabrication. The switch is designed with a clamped-clamped SU-8 (5 mu m)/Cu (2 mu m)/SU-8 (3 mu m) beam structure driven by electrostatic force, which is fabricated on a silicon substrate with a resistivity of similar to 5 Omega cm. Experimental results show that the switch can exhibit better than -4.48 dB insertion loss and -28.2 dB isolation up to 12 GHz. Such a large insertion loss is mainly caused by substrate loss which can be further reduced down to -0.75 dB as long as the substrate resistivity is increased up to 100 Omega cm.
URI: http://dx.doi.org/10.1088/0960-1317/21/2/025010
http://hdl.handle.net/11536/25846
ISSN: 0960-1317
DOI: 10.1088/0960-1317/21/2/025010
期刊: JOURNAL OF MICROMECHANICS AND MICROENGINEERING
Volume: 21
Issue: 2
結束頁: 
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