完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Hung, Chung Jung | en_US |
dc.contributor.author | Hung, Jeng Han | en_US |
dc.contributor.author | Lin, Pang | en_US |
dc.contributor.author | Tseng, Tseung Yuen | en_US |
dc.date.accessioned | 2014-12-08T15:38:10Z | - |
dc.date.available | 2014-12-08T15:38:10Z | - |
dc.date.issued | 2011 | en_US |
dc.identifier.issn | 0013-4651 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/26184 | - |
dc.identifier.uri | http://dx.doi.org/10.1149/1.3601862 | en_US |
dc.description.abstract | This study reports the electrochemical performance and stability of MnO(x)-multiwall carbon nanotubes (MWCNTs) nanocomposite/Ni pseudocapacitor electrodes fabricated by a modified electrophoretic deposition (EPD) method. The nanocomposite electrode consisting of highly dispersed manganese oxide on MWCNTs was synthesized by a redox titration method at room temperature. The electrochemical properties of the electrode were demonstrated by cyclic voltammetry. The mean specific capacitances at a constant scan rate of 100 mV/s of MnO(x)-MWCNTs nanocomposites without and with heat treatment at temperatures 150, 200, and 250 degrees C for 2 h are 378, 402, 445, and 469 F/g, respectively, which indicate an increase with increasing annealing temperature. During stability tests, the as-grown MnO(x)-MWCNTs nanocomposite electrode can preserve 80% of its original capacitance after 6000 cycles of operation which can be increased to 86% after annealing at 200 degrees C for 2 h. The EPD MnO(x)/MWCNTs coaxial nanocomposite pseudocapacitors with manganese oxide ionized by H(+) ion process exhibit high specific capacitance, fast reaction rate, high stability, and have high potential for practical applications. (C) 2011 The Electrochemical Society. [DOI: 10.1149/1.3601862] All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Electrophoretic Fabrication and Characterizations of Manganese Oxide/Carbon Nanotube Nanocomposite Pseudocapacitors | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1149/1.3601862 | en_US |
dc.identifier.journal | JOURNAL OF THE ELECTROCHEMICAL SOCIETY | en_US |
dc.citation.volume | 158 | en_US |
dc.citation.issue | 8 | en_US |
dc.citation.spage | A942 | en_US |
dc.citation.epage | A947 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000292154300013 | - |
dc.citation.woscount | 11 | - |
顯示於類別: | 期刊論文 |