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dc.contributor.authorChen, Yen-Liangen_US
dc.contributor.authorHsieh, Hung-Chihen_US
dc.contributor.authorWu, Wang-Tsungen_US
dc.contributor.authorWen, Bor-Jiunnen_US
dc.contributor.authorChang, Wei-Yaoen_US
dc.contributor.authorSu, Der-Chinen_US
dc.date.accessioned2014-12-08T15:38:24Z-
dc.date.available2014-12-08T15:38:24Z-
dc.date.issued2010-12-01en_US
dc.identifier.issn0141-9382en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.displa.2010.07.003en_US
dc.identifier.urihttp://hdl.handle.net/11536/26282-
dc.description.abstractThe two-dimensional refractive index distribution of a flexible indium tin oxide film deposited on a PET layer is measured before/after the bend-testing with an alternative technique based on Fresnel equations and the heterodyne interferometry. Their standard deviations are derived and they vary more obviously than the resistance variations measured in the conventional method. Hence the standard deviation of the refractive index can be used as the indicator to justify the durability of a flexible indium tin oxide film. The validity is demonstrated. (C) 2010 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectIndium tin oxide filmen_US
dc.subjectBending testen_US
dc.subjectRefractive indexen_US
dc.subjectElectro-optic modulationen_US
dc.subjectHeterodyne interferometryen_US
dc.titleAn alternative bend-testing technique for a flexible indium tin oxide filmen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.displa.2010.07.003en_US
dc.identifier.journalDISPLAYSen_US
dc.citation.volume31en_US
dc.citation.issue4-5en_US
dc.citation.spage191en_US
dc.citation.epage195en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000284293400005-
dc.citation.woscount3-
Appears in Collections:Articles


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