Hole distribution in YxPr1-xBa2Cu4O8 and YxPr1-xBa2Cu3O7 probed by X-ray absorption spectroscopy

doi:10.1016/j.physc.2004.03.144

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DC 欄位	值	語言
dc.contributor.author	Chen, JM	en_US
dc.contributor.author	Liu, SJ	en_US
dc.contributor.author	Lee, JM	en_US
dc.contributor.author	Lin, JY	en_US
dc.contributor.author	Gou, YS	en_US
dc.contributor.author	Yang, HD	en_US
dc.date.accessioned	2014-12-08T15:38:44Z	-
dc.date.available	2014-12-08T15:38:44Z	-
dc.date.issued	2004-08-01	en_US
dc.identifier.issn	0921-4534	en_US
dc.identifier.uri	http://dx.doi.org/10.1016/j.physc.2004.03.144	en_US
dc.identifier.uri	http://hdl.handle.net/11536/26507	-
dc.description.abstract	Utilizing high-resolution O K-edge X-ray absorption spectra, we report a comparative study on the variation of hole states with Pr doping for Y-x Pr1-xBa2Cu3O7 and YxPr1-xBa2 Cu-4 O-8. The depletion rate of hole carriers in the CuO2 planes with Pr doping in YxPr1-xBa2Cu4 O-8 is considerably slower than that in YxPr1-xBa2Cu3O7. The oxygen content affects the depletion rate of hole carriers in cuprates with Pr doping. (C) 2004 Elsevier B.V. All rights reserved.	en_US
dc.language.iso	en_US	en_US
dc.subject	X-ray absorption spectra	en_US
dc.subject	hole carriers	en_US
dc.title	Hole distribution in YxPr1-xBa2Cu4O8 and YxPr1-xBa2Cu3O7 probed by X-ray absorption spectroscopy	en_US
dc.type	Article; Proceedings Paper	en_US
dc.identifier.doi	10.1016/j.physc.2004.03.144	en_US
dc.identifier.journal	PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS	en_US
dc.citation.volume	408	en_US
dc.citation.issue		en_US
dc.citation.spage	818	en_US
dc.citation.epage	819	en_US
dc.contributor.department	電子物理學系	zh_TW
dc.contributor.department	物理研究所	zh_TW
dc.contributor.department	Department of Electrophysics	en_US
dc.contributor.department	Institute of Physics	en_US
dc.identifier.wosnumber	WOS:000224051700344	-
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