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dc.contributor.authorLapushkin, Ien_US
dc.contributor.authorZakharova, Aen_US
dc.contributor.authorYen, STen_US
dc.contributor.authorChao, KAen_US
dc.date.accessioned2014-12-08T15:38:49Z-
dc.date.available2014-12-08T15:38:49Z-
dc.date.issued2004-07-07en_US
dc.identifier.issn0953-8984en_US
dc.identifier.urihttp://dx.doi.org/10.1088/0953-8984/16/26/003en_US
dc.identifier.urihttp://hdl.handle.net/11536/26570-
dc.description.abstractWe investigate the phase transitions in InAs/GaSb quantum wells sandwiched between two wide-gap AlSb barrier layers under an external electric field perpendicular to interfaces. The Schrodinger and the Poisson equations are solved self-consistently to derive the subband dispersions, the potential profile, the electron charge distribution in the InAs layer, and the hole charge distribution in the GaSb layer. The Burt-Foreman envelope function theory and the scattering matrix method are used to solve the Schrodinger equation in the framework of the eight-band k (.) p model, including the spin-splitting of subbands in our calculation. We have found that in a thick InAs/GaSb quantum well, which has been investigated experimentally by Cooper et al (1998 Phys. Rev. B 57 11915), under low external electric fields, two electron levels stay below the highest hole level at zero in-plane wavevector k(parallel to) = 0. Then, the anticrossings of electron and hole levels produce several minigaps in the inplane dispersions, inside which the states of other subbands exist. As a result, the system is in a sernimetal phase. With increasing external electric field, the semimetal phase changes to semiconductor phase with only one hybridization gap. When all electron levels become higher than the hole levels at higher electric fields, the system has a semiconducting gap.en_US
dc.language.isoen_USen_US
dc.titleA self-consistent investigation of the semimetal-semiconductor transition in InAs/GaSb quantum wells under external electric fieldsen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1088/0953-8984/16/26/003en_US
dc.identifier.journalJOURNAL OF PHYSICS-CONDENSED MATTERen_US
dc.citation.volume16en_US
dc.citation.issue26en_US
dc.citation.spage4677en_US
dc.citation.epage4684en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000223086300005-
Appears in Collections:Conferences Paper


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