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dc.contributor.authorWang, Wen-Chiehen_US
dc.contributor.authorHuang, Zue-Deren_US
dc.contributor.authorCarchon, Geerten_US
dc.contributor.authorMercha, Abdelkarimen_US
dc.contributor.authorDecoutere, Stefaanen_US
dc.contributor.authorDe Raedt, Walteren_US
dc.contributor.authorWu, Chung-Yuen_US
dc.date.accessioned2014-12-08T15:38:50Z-
dc.date.available2014-12-08T15:38:50Z-
dc.date.issued2010en_US
dc.identifier.isbn978-1-4244-5309-2en_US
dc.identifier.issn0271-4302en_US
dc.identifier.urihttp://hdl.handle.net/11536/26598-
dc.identifier.urihttp://dx.doi.org/10.1109/ICCSIT.2010.5564511en_US
dc.description.abstractTwo 23 GHz low-noise amplifier (LNA) have been designed and implemented by 45 nm planar bulk-CMOS technology with high-Q above-IC inductors. In the designed LNAs, the structure of cascode amplifier with source inductive degeneration is used. All high-Q above-IC inductors have been implemented by thin-film wafer-level packaging (WLP) technology. The fabricated one-stage LNA has a good linearity where the input 1 dB compression point (IP(-1dB)) is -9.5 dBm and the input referred third-order intercept point (P(IIP3)) is +2.25 dBm. It is operated with a 1 V power supply drawing a current of only 3.6 mA. The fabricated one-stage LNA has demonstrated a 4 dB noise figure (NF) and a 7.1 dB gain at the peak gain frequency of 23 GHz. Moreover, the fabricated two-stage LNA has the IP(-1dB) of -16 dBm and the P(IIP3) of -4.2 dBm. It drains 9.3 mA from 1-V power supply. This two-stage LNA has demonstrated a 4.4 dB NF and a 11.6 dB gain at the peak gain frequency of 23.4 GHz. The fabricated one-stage LNA has the highest figure-of-merit (FOM). The experimental results have proved the suitability of 45 nm gate length planar bulk-CMOS devices for RF ICs above 20 GHz.en_US
dc.language.isoen_USen_US
dc.title45-nm Planar Bulk-CMOS 23-GHz LNAs With High-Q Above-IC Inductorsen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/ICCSIT.2010.5564511en_US
dc.identifier.journal2010 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMSen_US
dc.citation.spage741en_US
dc.citation.epage744en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000287216000185-
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