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dc.contributor.authorLee, BCen_US
dc.contributor.authorLee, CPen_US
dc.date.accessioned2014-12-08T15:38:53Z-
dc.date.available2014-12-08T15:38:53Z-
dc.date.issued2004-07-01en_US
dc.identifier.issn0957-4484en_US
dc.identifier.urihttp://dx.doi.org/10.1088/0957-4484/15/7/024en_US
dc.identifier.urihttp://hdl.handle.net/11536/26631-
dc.description.abstractA new method for fabricating semiconductor quantum rings has been developed. Instead of using the conventional GaAs cap layer, we used the GaAs/AlAs cap layer for the ring formation. The additional AlAs layer impedes the inward diffusion of the Ga and Al atoms and results in nicely formed ring structures with a more relaxed growth condition. Because of this layer, the ring-shaped structure can be maintained with a higher annealing temperature without being washed out by the intermixing of Ga/Al with In in the central region of the dots. The shape and the strain distribution of quantum rings have also been characterized by transmission electron microscopy.en_US
dc.language.isoen_USen_US
dc.titleFormation of semiconductor quantum rings using GaAs/AlAs partially capped layersen_US
dc.typeArticleen_US
dc.identifier.doi10.1088/0957-4484/15/7/024en_US
dc.identifier.journalNANOTECHNOLOGYen_US
dc.citation.volume15en_US
dc.citation.issue7en_US
dc.citation.spage848en_US
dc.citation.epage850en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000223025900033-
dc.citation.woscount13-
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