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dc.contributor.authorLin, CCen_US
dc.contributor.authorLai, CHen_US
dc.contributor.authorWei, DHen_US
dc.contributor.authorHsu, YJen_US
dc.contributor.authorShieh, HPDen_US
dc.date.accessioned2014-12-08T15:39:00Z-
dc.date.available2014-12-08T15:39:00Z-
dc.date.issued2004-06-01en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.1689911en_US
dc.identifier.urihttp://hdl.handle.net/11536/26688-
dc.description.abstractThe orientation of element-specific moments was determined by using x-ray magnetic circular dichroism spectroscopy to explore exchange anisotropy of TbFe/Co bilayers. Perpendicular anisotropy of 15 Angstrom Co was induced by TbFe through exchange coupling, resulting in the out-of-plane Co moments. With increasing the thickness, Co moments were gradually tilted to the in-plane orientation because of increasing planar anisotropy. In the bilayer with thick Co, interfacial Fe moments were unidirectionally aligned in the plane, leading to in-plane exchange bias of Co. The coercivity and exchange bias field of Co in the bilayers exhibited a strong dependence on Co thickness. (C) 2004 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleThickness dependence of Co anisotropy in TbFe/Co exchange-coupled bilayersen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1063/1.1689911en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume95en_US
dc.citation.issue11en_US
dc.citation.spage6846en_US
dc.citation.epage6848en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000221657900111-
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