完整後設資料紀錄
DC 欄位語言
dc.contributor.authorChen, HCen_US
dc.contributor.authorLee, CEen_US
dc.date.accessioned2014-12-08T15:39:09Z-
dc.date.available2014-12-08T15:39:09Z-
dc.date.issued2004-06-01en_US
dc.identifier.issn1072-4761en_US
dc.identifier.urihttp://hdl.handle.net/11536/26755-
dc.description.abstractA variety of control and dummy wafers (CD wafers) are utilized in wafer fabrication to enhance product quality and process stability. Wafer fabs downgrade and recycle used CD wafers for cost-down purposes. Downgrading and release rules therefore become crucial issues in CD-wafer management activities but only few studies covered this topic. This study presents a CD-wafer management system, the push system, focusing on downgrading and release rules. The push system attempts to reduce machine delay time, increase recycled usages of CD-wafer lots, and attain a reasonable CD-wafer work-in-process (WIP) level without lowering the throughput rate of product wafers. This study also employs a simulation model of a simplified fab to analyze the performance of the proposed push system. Simulation results demonstrate that the push system leads to efficient utilization of CD wafers. Significance: This work proposes a systematic system, the push system, for downgrading and releases of control and dummy wafers in wafer fabrication. The issue discussed in this study is crucial and practical for wafer fabrication but is seldom cited in research papers.en_US
dc.language.isoen_USen_US
dc.subjectcontrol waferen_US
dc.subjectdummy wafersen_US
dc.subjectdowngrading and release rulesen_US
dc.subjectpush systemen_US
dc.subjectmachine delay timeen_US
dc.subjectrecycled usagesen_US
dc.titleDowngrading and release rules for control and dummy wafersen_US
dc.typeArticleen_US
dc.identifier.journalINTERNATIONAL JOURNAL OF INDUSTRIAL ENGINEERING-THEORY APPLICATIONS AND PRACTICEen_US
dc.citation.volume11en_US
dc.citation.issue2en_US
dc.citation.spage197en_US
dc.citation.epage206en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.identifier.wosnumberWOS:000222229900010-
dc.citation.woscount0-
顯示於類別:期刊論文