Crosstalk studies of in-plane switching mode under different pixel- and common-electrode configurations

Abstract

In thin-film-transistor liquid-crystal display (TFT-LCD), particularly pixel-electrode configuration of in-plane switching (IPS) mode, crosstalk caused by capacitive coupling between pixel electrodes and data lines could result in image degradation. We derived the capacitive coupling ratio (CCR) of the IPS cell and analyzed the CCR of three conventional TFT-IPS pixel- and common-electrode structures to quantity the crosstalk properties. The effect of coupling voltage on electro-optics characteristics has been investigated. Our results showed that a common electrode placed adjacent to the data line could shield capacitive coupling between the data line and the pixel electrodes, and reduce CCR from 13% to 2.4% and crosstalk intensity ratio (CIR) from 21.2% to 3.9%. We also report the common-overlapping-pixel structure that not only increases the aperture ratio by 1.28 times but also reduces CCR from 13% to 9.1%.