Title: Electron transition energy for vertically coupled InAs/GaAs semiconductor quantum dots and rings
Authors: Li, YM
Lu, HM
友訊交大聯合研發中心
D Link NCTU Joint Res Ctr
Keywords: vertically coupled quantum dots;vertically coupled quantum rings;semiconductor artificial molecules;electron transition energy;magnetic field effects;modeling and simulation
Issue Date: 1-Apr-2004
Abstract: We investigate the transition energy of vertically coupled quantum dots and rings (VCQDs and VCQRs) with a three-dimensional (3D) model under an applied magnetic field. The model formulation includes (1) the position-dependent effective mass Hamiltonian in the nonparabolic approximation for electrons, (2) the position-dependent effective mass Hamiltonian in the parabolic approximation for holes, (3) the finite hard-wall confinement potential, and (4) the Ben Daniel-Duke boundary conditions. We explore small VCQDs and VCQRs with disk (DI) and conical (CO) shapes. For small VCQDs and VCQRs, the electron-hole transition energy is dominated by the interdistance d which plays a crucial role in the tunable states of structures. Under zero magnetic field, there is about 25% variation in the electron ground state energy for both InAs/GaAs DI-shaped VCQDs and VCQRs with d varying from 0.4 nm to 4.8 nm. The energy spectra of the CO-shaped VCQDs are the most stable against the structure interdistance deviations (among dots and rings of the same volume). For a fixed d, VCQDs show diamagnetic shift; contrarily, VCQRs imply a nonperiodical transition among the lowest electron energy states. The energy band gap of VCQRs oscillates nonperiodically between the lowest electron and holes states as a function of external magnetic fields. Our investigation is constructive for studying the magneto-optical phenomena of the nanoscale semiconductor artificial molecules.
URI: http://dx.doi.org/10.1143/JJAP.43.2104
http://hdl.handle.net/11536/26895
ISSN: 0021-4922
DOI: 10.1143/JJAP.43.2104
Journal: JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
Volume: 43
Issue: 4B
Begin Page: 2104
End Page: 2109
Appears in Collections:Conferences Paper


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