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dc.contributor.authorFong, HHen_US
dc.contributor.authorSo, SKen_US
dc.contributor.authorSham, WYen_US
dc.contributor.authorLo, CFen_US
dc.contributor.authorWu, YSen_US
dc.contributor.authorChen, CHen_US
dc.date.accessioned2014-12-08T15:39:27Z-
dc.date.available2014-12-08T15:39:27Z-
dc.date.issued2004-03-08en_US
dc.identifier.issn0301-0104en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.chemphys.2003.11.008en_US
dc.identifier.urihttp://hdl.handle.net/11536/26950-
dc.description.abstractThe charge transporting properties of rubrene (5,6,11,12-tetraphenylnaphthacene or RB), and a new rubrene-based complex, tetra(t-butyl)-rubrene [2,8-di(t-butyl)-5,11-di[4-(t-butyl)phenyl]-6,12-diphenylnaphthacene or TBRB], were examined in the form of amorphous films as functions of electric field and temperature by means of time-of-flight technique. At room temperature, the hole mobility mu for RB is 7-9 x 10(-3) cm(2) V-1 s(-1) whereas mu for the more bulky TBRB is about 2 x 10(-3) cm(2) V-1 s(-1). The microscopic conduction mechanism in both materials can be modeled by the Gaussian disorder model in which hopping conduction occurs through a manifold of sites with energetic and positional disorder. The energetic disorder in RB and TBRB is almost identical and is about 78 meV in each case, and is mainly controlled by van der Waals interaction. The t-butyl groups in TBRB induce large fluctuations in the spatial separation among TBRB molecules and result in an increase in the positional disorder, and hence a reduction in the hole mobility. (C) 2003 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectrubreneen_US
dc.subjecthole mobilityen_US
dc.subjectorganic charge transportersen_US
dc.titleEffects of tertiary butyl substitution on the charge transporting properties of rubrene-based filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.chemphys.2003.11.008en_US
dc.identifier.journalCHEMICAL PHYSICSen_US
dc.citation.volume298en_US
dc.citation.issue1-3en_US
dc.citation.spage119en_US
dc.citation.epage123en_US
dc.contributor.department友訊交大聯合研發中心zh_TW
dc.contributor.departmentD Link NCTU Joint Res Ctren_US
dc.identifier.wosnumberWOS:000189216600012-
dc.citation.woscount35-
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