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dc.contributor.authorWu, JHen_US
dc.contributor.authorShieh, JMen_US
dc.contributor.authorDai, BTen_US
dc.contributor.authorWu, YCSen_US
dc.date.accessioned2014-12-08T15:39:45Z-
dc.date.available2014-12-08T15:39:45Z-
dc.date.issued2004en_US
dc.identifier.issn1099-0062en_US
dc.identifier.urihttp://hdl.handle.net/11536/27150-
dc.identifier.urihttp://dx.doi.org/10.1149/1.1718258en_US
dc.description.abstractHydrogenated microcrystalline silicon (muc-Si:H) channel layers were synthesized at a temperature below 100degreesC by inductively coupled plasma (ICP) methods. High ionization efficiency and low ion bombardment from the ICP, enabled the use of high ICP power and, thus, extremely dense plasma or markedly increased electron temperature, promoting the diffusion capability of the reactive radicals that eventually yield ICP muc-Si:H films with large grains of several tens of nanometers, a high deposition rate of 5 Angstrom/s, and a smooth roughness of similar to1 nm. Accordingly, the epitaxial growth of muc-Si:H films at room temperature is demonstrated. (C) 2004 The Electrochemical Society.en_US
dc.language.isoen_USen_US
dc.titleSynthesis of microcrystalline silicon at room temperature using ICPen_US
dc.typeArticleen_US
dc.identifier.doi10.1149/1.1718258en_US
dc.identifier.journalELECTROCHEMICAL AND SOLID STATE LETTERSen_US
dc.citation.volume7en_US
dc.citation.issue6en_US
dc.citation.spageG128en_US
dc.citation.epageG130en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000221887500024-
dc.citation.woscount16-
Appears in Collections:Articles