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dc.contributor.authorWang, S. Y.en_US
dc.contributor.authorLing, H. S.en_US
dc.contributor.authorLo, M. C.en_US
dc.contributor.authorLee, C. P.en_US
dc.date.accessioned2014-12-08T15:40:01Z-
dc.date.available2014-12-08T15:40:01Z-
dc.date.issued2009-11-01en_US
dc.identifier.issn1350-4495en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.infrared.2009.05.033en_US
dc.identifier.urihttp://hdl.handle.net/11536/27343-
dc.description.abstractQDIPs with thin inserted AlGaAs layers adjacent to the QDs were investigated for the tailoring of detection wavelength and device performance. Simple InAs/GaAs QDIPs and DWELL QDIPs with different insertion layer structure were studied. The thin AlGaAs layer is shown to effectively modify the electron wavefunction and associated confined state energies which lead to the change of the detection wavelength and the polarization dependent quantum efficiency. Furthermore. the dark current and gain also change with different device structures. The insertion of AlGaAs layers provides an additional freedom of tuning the electronics states involved in the infrared detection and also enables the improvement of the absorption and device performance. (C) 2009 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectQuantum doten_US
dc.subjectIntersubbanden_US
dc.subjectInfrared detectoren_US
dc.titleDetection wavelength and device performance tuning of InAs QDIPs with thin AlGaAs layersen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.infrared.2009.05.033en_US
dc.identifier.journalINFRARED PHYSICS & TECHNOLOGYen_US
dc.citation.volume52en_US
dc.citation.issue6en_US
dc.citation.spage264en_US
dc.citation.epage267en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000273240700011-
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