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dc.contributor.authorWang, SYen_US
dc.contributor.authorChen, SCen_US
dc.contributor.authorLin, SDen_US
dc.contributor.authorLin, CJen_US
dc.contributor.authorLee, CPen_US
dc.date.accessioned2014-12-08T15:40:15Z-
dc.date.available2014-12-08T15:40:15Z-
dc.date.issued2003-10-01en_US
dc.identifier.issn1350-4495en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S1350-4495(03)00164-6en_US
dc.identifier.urihttp://hdl.handle.net/11536/27480-
dc.description.abstractInAs/GaAs quantum dot infrared photodetectors were fabricated with quantum dots grown at three different temperatures. Large detection wavelength shift (5-14.5 mum) was demonstrated by changing 40 degrees of the epitaxy temperature. The smaller quantum dots grown at lower temperature generate 14.5 mum responses. The detectivity of the normal incident 15 mum QDIP at 77 K is 3 x 10(8) cm Hz(1/2)/W. A three-color detector was also demonstrated with quantum dots grown at medium temperature. The three-color detection comes from two groups of different sizes of dots within one QD layer. This new type of multicolor detector shows unique temperature tuning behavior that was never reported before. (C) 2003 Elsevier B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.subjectquantum doten_US
dc.subjectintersubbanden_US
dc.subjectinfrared detectoren_US
dc.titleInAs/GaAs quantum dot infrared photodetectors with different growth temperaturesen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/S1350-4495(03)00164-6en_US
dc.identifier.journalINFRARED PHYSICS & TECHNOLOGYen_US
dc.citation.volume44en_US
dc.citation.issue5-6en_US
dc.citation.spage527en_US
dc.citation.epage532en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000186163600027-
Appears in Collections:Conferences Paper


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