標題: Characteristics of oxide breakdown and related impact on device of ultrathin (2.2 nm) silicon dioxide
作者: Su, HD
Chiou, BS
Wu, SY
Chang, MH
Lee, KH
Chen, YS
Cha, CP
See, YC
Sun, JYC
電子工程學系及電子研究所
Department of Electronics Engineering and Institute of Electronics
關鍵字: ultrathin oxide;breakdown;TDDB;DDT;reliability
公開日期: 1-九月-2003
摘要: The oxide breakdown characteristics of ultrathin oxide (2.2 nm) have been studied in this paper. Light emission microscopy (EMMI) analysis shows that each breakdown has a specific failure location with a random distribution. Gate leakage current increases for all soft breakdown events are similar. After soft breakdown, the I-V curve still shows the representative direct tunneling characteristics and can be fitted using a dual direct tunneling (DDT) model. Soft breakdown has no effect on the drain current of long-channel devices. Breakdown at the polyedge appears to be of the hard-breakdown mode and results in an abrupt increase in gate current. For short-channel devices, the polyedge is always within the damaged region of an oxide because the channel is shorter than the damaged region of the oxide. Hence, only hard breakdown resulting in permanent damage is observed in short-channel devices.
URI: http://dx.doi.org/10.1143/JJAP.42.5521
http://hdl.handle.net/11536/27602
ISSN: 0021-4922
DOI: 10.1143/JJAP.42.5521
期刊: JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS
Volume: 42
Issue: 9A
起始頁: 5521
結束頁: 5526
顯示於類別:期刊論文


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