標題: | Observation of a crossover of the inelastic electron scattering in Sc100-xAgx thick films |
作者: | Lee, TC Lin, JJ Chang, SF 電子物理學系 物理研究所 Department of Electrophysics Institute of Physics |
公開日期: | 15-八月-2003 |
摘要: | We have made a series of thick Sc films doped with different amounts of Ag, which results in a systematic decrease in the resistivities, i.e., disorder, of the films. From measurements of the low-field magnetoresistances and comparison with three-dimensional weak-localization theoretical predictions, the electron dephasing times are extracted in every film. We find a crossover of the inelastic electron process from the critical electron-electron scattering to the electron-phonon scattering as the disorder decreases and the system progressively moves away from the Anderson localization. |
URI: | http://dx.doi.org/10.1103/PhysRevB.68.073407 http://hdl.handle.net/11536/27639 |
ISSN: | 2469-9950 |
DOI: | 10.1103/PhysRevB.68.073407 |
期刊: | PHYSICAL REVIEW B |
Volume: | 68 |
Issue: | 7 |
起始頁: | 0 |
結束頁: | 0 |
顯示於類別: | 期刊論文 |