標題: Observation of a crossover of the inelastic electron scattering in Sc100-xAgx thick films
作者: Lee, TC
Lin, JJ
Chang, SF
電子物理學系
物理研究所
Department of Electrophysics
Institute of Physics
公開日期: 15-八月-2003
摘要: We have made a series of thick Sc films doped with different amounts of Ag, which results in a systematic decrease in the resistivities, i.e., disorder, of the films. From measurements of the low-field magnetoresistances and comparison with three-dimensional weak-localization theoretical predictions, the electron dephasing times are extracted in every film. We find a crossover of the inelastic electron process from the critical electron-electron scattering to the electron-phonon scattering as the disorder decreases and the system progressively moves away from the Anderson localization.
URI: http://dx.doi.org/10.1103/PhysRevB.68.073407
http://hdl.handle.net/11536/27639
ISSN: 2469-9950
DOI: 10.1103/PhysRevB.68.073407
期刊: PHYSICAL REVIEW B
Volume: 68
Issue: 7
起始頁: 0
結束頁: 0
顯示於類別:期刊論文


文件中的檔案:

  1. 1a1b76df1c742dc9c8138e9c36dc278b.pdf

若為 zip 檔案,請下載檔案解壓縮後,用瀏覽器開啟資料夾中的 index.html 瀏覽全文。