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dc.contributor.authorChiu, Yen_US
dc.contributor.authorRambabu, Uen_US
dc.contributor.authorHsu, MHen_US
dc.contributor.authorShieh, HPDen_US
dc.contributor.authorChen, CYen_US
dc.contributor.authorLin, HHen_US
dc.date.accessioned2014-12-08T15:40:30Z-
dc.date.available2014-12-08T15:40:30Z-
dc.date.issued2003-08-01en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.1589178en_US
dc.identifier.urihttp://hdl.handle.net/11536/27648-
dc.description.abstractWe report the fabrication of nanoparticle silver oxide thin films by rf magnetron sputtering and characterization of their nonlinear optical properties. The chemical decomposition and reversibility of AgOx compounds were studied by thermogravimetric analysis, differential scanning calorimetry, and x-ray diffraction. Electron spectroscopy for chemical analysis measurements revealed a 0.5 eV negative binding energy shift from AgO to Ag2O phase. The effect of particle plasmon resonance was confirmed by the absorption band shift with increased Ag2O Particle size. The measured third-order nonlinear susceptibility (chi(3) = 3.4 x 10(-7) esu) and response time (27 ps) of the Ag2O nanoparticles makes it promising for applications in all-optical switching devices and optical data storage systems. (C) 2003 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleFabrication and nonlinear optical properties of nanoparticle silver oxide filmsen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.1589178en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume94en_US
dc.citation.issue3en_US
dc.citation.spage1996en_US
dc.citation.epage2001en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000184400400106-
dc.citation.woscount57-
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