STRUCTURE OF THE NEW TLBA2PRCU2O7-X BY RIETVELD ANALYSIS

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DC Field	Value	Language
dc.contributor.author	LEE, TJ	en_US
dc.contributor.author	FUN, HK	en_US
dc.contributor.author	WANG, A	en_US
dc.contributor.author	CHOU, CH	en_US
dc.contributor.author	LAI, CC	en_US
dc.contributor.author	KU, HC	en_US
dc.date.accessioned	2014-12-08T15:04:15Z	-
dc.date.available	2014-12-08T15:04:15Z	-
dc.date.issued	1993-12-01	en_US
dc.identifier.issn	0577-9073	en_US
dc.identifier.uri	http://hdl.handle.net/11536/2765	-
dc.description.abstract	The crystalline structure of new TlBa2PrCu2O7-y was obtained at room temperature from X-ray powder diffraction with CuKalpha radiation using Rietveld analysis. TlBa2PrCu2O7-x is semiconducting at room temperature with a TlBa2CaCu2O7 type (1212) structure (space group P4/mmm) and cell parameters a = 3.91836(3) angstrom, c = 12.5498(2) angstrom. The structure was refined for 15 parameters to R(wp) = 6.89 %, R(p) = 5.09 % for 6323 step intensities and R(b) = 13.24 % for 138 reflections.	en_US
dc.language.iso	en_US	en_US
dc.title	STRUCTURE OF THE NEW TLBA2PRCU2O7-X BY RIETVELD ANALYSIS	en_US
dc.type	Article; Proceedings Paper	en_US
dc.identifier.journal	CHINESE JOURNAL OF PHYSICS	en_US
dc.citation.volume	31	en_US
dc.citation.issue	6	en_US
dc.citation.spage	1255	en_US
dc.citation.epage	1260	en_US
dc.contributor.department	電控工程研究所	zh_TW
dc.contributor.department	Institute of Electrical and Control Engineering	en_US
dc.identifier.wosnumber	WOS:A1993MU73000068	-
Appears in Collections:	Conferences Paper