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dc.contributor.authorLin, JYen_US
dc.contributor.authorSu, DCen_US
dc.date.accessioned2014-12-08T15:41:09Z-
dc.date.available2014-12-08T15:41:09Z-
dc.date.issued2003-04-01en_US
dc.identifier.issn0030-4018en_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0030-4018(03)01183-0en_US
dc.identifier.urihttp://hdl.handle.net/11536/28007-
dc.description.abstractWe designed a method for measuring chiral parameter and average refractive index of an isotropic chiral medium using critical angle phenomena. Linearly polarized light is guided to project onto the interface of a semi-spherical glass and a chiral liquid. The reflected light passes through an analyzer to extract the interference signal of s- and p-polarization lights. Their phase difference is first optimized by a suitable optical arrangement and subsequently measured by a heterodyne interferometer. The result, then, is fed into equations to estimate the chiral parameter. We determine the average index of refraction from the critical angle occurred at the discontinuity of the phase difference of two polarized lights. Our method of measurement has the implicational merits of both common-path interferometry and heterodyne interferometry. (C) 2003 Elsevier Science B.V. All rights reserved.en_US
dc.language.isoen_USen_US
dc.titleA new method for measuring the chiral parameter and the average refractive index of a chiral liquiden_US
dc.typeArticleen_US
dc.identifier.doi10.1016/S0030-4018(03)01183-0en_US
dc.identifier.journalOPTICS COMMUNICATIONSen_US
dc.citation.volume218en_US
dc.citation.issue4-6en_US
dc.citation.spage317en_US
dc.citation.epage323en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.identifier.wosnumberWOS:000181990900016-
dc.citation.woscount14-
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