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dc.contributor.authorLin, SDen_US
dc.contributor.authorLee, CPen_US
dc.date.accessioned2014-12-08T15:41:13Z-
dc.date.available2014-12-08T15:41:13Z-
dc.date.issued2003-03-01en_US
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.1543631en_US
dc.identifier.urihttp://hdl.handle.net/11536/28036-
dc.description.abstractUsing InGaAs quantum well emitters, AlGaAs/GaAs double barrier resonant tunneling diodes with and without self-assembled InAs/GaAs quantum dots (QDs) have been studied extensively. Because the energy state of the emitter was lower than the level of the ground state within InAs QDs, the resonant tunneling was observed clearly near zero bias in all devices. From the results of bias-dependent photoluminescence and current-voltage characteristics, we obtain unambiguously the resonant tunneling through the InAs QDs, both controllably and reproducibly. (C) 2003 American Institute of Physics.en_US
dc.language.isoen_USen_US
dc.titleTunneling through InAs quantum dots in AlGaAs/GaAs double barrier resonant tunneling diodes with InGaAs quantum well emittersen_US
dc.typeArticleen_US
dc.identifier.doi10.1063/1.1543631en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.citation.volume93en_US
dc.citation.issue5en_US
dc.citation.spage2952en_US
dc.citation.epage2956en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000181307000101-
dc.citation.woscount2-
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