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dc.contributor.authorChen, Shih-Hungen_US
dc.contributor.authorKer, Ming-Douen_US
dc.date.accessioned2014-12-08T15:41:15Z-
dc.date.available2014-12-08T15:41:15Z-
dc.date.issued2009en_US
dc.identifier.isbn978-1-4244-2781-9en_US
dc.identifier.urihttp://hdl.handle.net/11536/28053-
dc.description.abstractA power-rail ESD clamp circuit with a new proposed ESD-transient detection circuit which adopts a ultra small capacitor to achieve the required functions has been presented and substantiated to own a long turn-on duration and high turn-on efficiency. In addition, the power-rail ESD clamp circuits with the new proposed ESD-transient detection circuit also presented an excellent immunity against the mis-trigger and the latch-on event under the fast power-on condition.en_US
dc.language.isoen_USen_US
dc.titleDESIGN OF ON-CHIP POWER-RAIL ESD CLAMP CIRCUIT WITH ULTR-SMALL CAPACITANCE TO DETECT ESD TRANSITIONen_US
dc.typeProceedings Paperen_US
dc.identifier.journal2009 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), PROCEEDINGS OF TECHNICAL PROGRAMen_US
dc.citation.spage327en_US
dc.citation.epage330en_US
dc.contributor.department電機學院zh_TW
dc.contributor.departmentCollege of Electrical and Computer Engineeringen_US
dc.identifier.wosnumberWOS:000271941200082-
Appears in Collections:Conferences Paper