Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Chen, Shih-Hung | en_US |
dc.contributor.author | Ker, Ming-Dou | en_US |
dc.date.accessioned | 2014-12-08T15:41:15Z | - |
dc.date.available | 2014-12-08T15:41:15Z | - |
dc.date.issued | 2009 | en_US |
dc.identifier.isbn | 978-1-4244-2781-9 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/28053 | - |
dc.description.abstract | A power-rail ESD clamp circuit with a new proposed ESD-transient detection circuit which adopts a ultra small capacitor to achieve the required functions has been presented and substantiated to own a long turn-on duration and high turn-on efficiency. In addition, the power-rail ESD clamp circuits with the new proposed ESD-transient detection circuit also presented an excellent immunity against the mis-trigger and the latch-on event under the fast power-on condition. | en_US |
dc.language.iso | en_US | en_US |
dc.title | DESIGN OF ON-CHIP POWER-RAIL ESD CLAMP CIRCUIT WITH ULTR-SMALL CAPACITANCE TO DETECT ESD TRANSITION | en_US |
dc.type | Proceedings Paper | en_US |
dc.identifier.journal | 2009 INTERNATIONAL SYMPOSIUM ON VLSI DESIGN, AUTOMATION AND TEST (VLSI-DAT), PROCEEDINGS OF TECHNICAL PROGRAM | en_US |
dc.citation.spage | 327 | en_US |
dc.citation.epage | 330 | en_US |
dc.contributor.department | 電機學院 | zh_TW |
dc.contributor.department | College of Electrical and Computer Engineering | en_US |
dc.identifier.wosnumber | WOS:000271941200082 | - |
Appears in Collections: | Conferences Paper |