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dc.contributor.authorTsui, BYen_US
dc.contributor.authorHuang, CFen_US
dc.date.accessioned2014-12-08T15:41:16Z-
dc.date.available2014-12-08T15:41:16Z-
dc.date.issued2003-03-01en_US
dc.identifier.issn0741-3106en_US
dc.identifier.urihttp://dx.doi.org/10.1109/LED.2003.809528en_US
dc.identifier.urihttp://hdl.handle.net/11536/28056-
dc.description.abstractThis paper explores the characteristics of the binary alloys Th-Pt and Ta-Ti for gate electrode application. With a proper composition of high and low work function metals, the work function of the metal alloys can be modulated from 4.16 eV to 5.05 eV continuously. The alloys show good thermal stability and inner chemical activity on both silicon dioxide and hafnium dioxide. Thermal stress generated from the alloy film increases interface state density and hence effective oxide charges. This problem can be greatly reduced with W/Ta-Pt stack structure, where W acts as the main conducting metal and Ta-Pt acts as work function control metal. All of these properties make them suitable for use in all device applications.en_US
dc.language.isoen_USen_US
dc.subjectalloyen_US
dc.subjectmetal gateen_US
dc.subjectwork functionen_US
dc.titleWide range work function modulation of binary alloys for MOSFET applicationen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/LED.2003.809528en_US
dc.identifier.journalIEEE ELECTRON DEVICE LETTERSen_US
dc.citation.volume24en_US
dc.citation.issue3en_US
dc.citation.spage153en_US
dc.citation.epage155en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000183268000010-
dc.citation.woscount54-
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