Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | CHIN, A | en_US |
dc.contributor.author | CHENG, TM | en_US |
dc.contributor.author | PENG, SP | en_US |
dc.contributor.author | OSMAN, Z | en_US |
dc.contributor.author | DAS, U | en_US |
dc.contributor.author | CHANG, CY | en_US |
dc.date.accessioned | 2014-12-08T15:04:18Z | - |
dc.date.available | 2014-12-08T15:04:18Z | - |
dc.date.issued | 1993-10-25 | en_US |
dc.identifier.issn | 0003-6951 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.110481 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/2812 | - |
dc.description.abstract | Strong enhancement in the luminescence intensity is observed in Al0.22Ga0.78As epitaxial layers grown on misoriented (111)B GaAs at 636-degrees-C. For 3-degrees misorientation, the luminescence intensity is almost 10 times that of (100) layers and the luminescence efficiency is an order of magnitude stronger than that of (100). (100) Al0.4Ga0.6As/GaAs quantum well laser diode structures grown under identical conditions with a low threshold current density of 150 A/cm2 are indications of excellent AlGaAs material quality. Electron mobility for 3-degrees misoriented (111) Al0.25Ga0.75As is about 10% higher than that for side-by-side grown (100). The strong luminescence associated with a large red shift of 90 meV, the 10% mobility enhancement, and wirelike structure shown in transmission electron microscopy are indicative of the natural formation of quantized structures. | en_US |
dc.language.iso | en_US | en_US |
dc.title | STRONG LUMINESCENCE INTENSITIES IN AL0.22GA0.78AS GROWN ON MISORIENTED (111)B GAAS | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.110481 | en_US |
dc.identifier.journal | APPLIED PHYSICS LETTERS | en_US |
dc.citation.volume | 63 | en_US |
dc.citation.issue | 17 | en_US |
dc.citation.spage | 2381 | en_US |
dc.citation.epage | 2383 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:A1993MD95900025 | - |
dc.citation.woscount | 14 | - |
Appears in Collections: | Articles |