完整後設資料紀錄
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dc.contributor.authorLin, KCen_US
dc.contributor.authorShieh, JMen_US
dc.contributor.authorChang, SCen_US
dc.contributor.authorDai, BTen_US
dc.contributor.authorChen, CFen_US
dc.contributor.authorFeng, MSen_US
dc.contributor.authorLi, YHen_US
dc.date.accessioned2014-12-08T15:41:49Z-
dc.date.available2014-12-08T15:41:49Z-
dc.date.issued2002-11-01en_US
dc.identifier.issn1071-1023en_US
dc.identifier.urihttp://dx.doi.org/10.1116/1.1517262en_US
dc.identifier.urihttp://hdl.handle.net/11536/28434-
dc.description.abstract100 nm vias were completely filled with copper for interconnect applications using an electrolyte in the presence of polyethylene glycols (PEG) and a hybrid-mode additive, benzotriazole (BTA). Electrochemical analyses indicated that BTA with a higher concentration inhibited the copper deposition rate, whereas BTA with a lower concentration accelerated the copper deposition rate. This electrolyte thus generated an enhanced deposition gradient within a gap because the PEG molecules and the high concentration of BTA, adsorbed at the opening of the gap, inhibited the deposition. Meanwhile, a little BTA diffused into the inner part of the gap and thus accelerated the deposition of copper. Therefore, this two-component (PEG and BTA) additive electrolyte had the capacity of a three-additive bath (accelerators, suppressors, and levelers). (C) 2002 American Vacuum Society.en_US
dc.language.isoen_USen_US
dc.titleLeveling effects of copper electrolytes with hybrid-mode additivesen_US
dc.typeArticleen_US
dc.identifier.doi10.1116/1.1517262en_US
dc.identifier.journalJOURNAL OF VACUUM SCIENCE & TECHNOLOGY Ben_US
dc.citation.volume20en_US
dc.citation.issue6en_US
dc.citation.spage2233en_US
dc.citation.epage2237en_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.identifier.wosnumberWOS:000180307300011-
dc.citation.woscount6-
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