統計資料
總造訪次數
| 檢視 | |
|---|---|
| Investigation of Channel Backscattering Characteristics for Nanoscale SOI MOSFETs Using a New Temperature-Dependent Method | 112 |
本月總瀏覽
檔案下載
| 檢視 |
|---|
國家瀏覽排行
| 檢視 | |
|---|---|
| 中國 | 97 |
| 美國 | 15 |
縣市瀏覽排行
| 檢視 | |
|---|---|
| Shenzhen | 95 |
| Menlo Park | 10 |
| Kensington | 4 |
| Beijing | 2 |
| Redmond | 1 |
| 檢視 | |
|---|---|
| Investigation of Channel Backscattering Characteristics for Nanoscale SOI MOSFETs Using a New Temperature-Dependent Method | 112 |
| 檢視 |
|---|
| 檢視 | |
|---|---|
| 中國 | 97 |
| 美國 | 15 |
| 檢視 | |
|---|---|
| Shenzhen | 95 |
| Menlo Park | 10 |
| Kensington | 4 |
| Beijing | 2 |
| Redmond | 1 |