Analytical evaluation of the MoM matrix elements for the capacitance of a charged plate

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DC 欄位	值	語言
dc.contributor.author	Kuo, JT	en_US
dc.contributor.author	Su, KY	en_US
dc.date.accessioned	2014-12-08T15:42:25Z	-
dc.date.available	2014-12-08T15:42:25Z	-
dc.date.issued	2002-05-01	en_US
dc.identifier.issn	0018-9480	en_US
dc.identifier.uri	http://dx.doi.org/10.1109/22.999161	en_US
dc.identifier.uri	http://hdl.handle.net/11536/28802	-
dc.description.abstract	Closed-form expression is derived for the fourfold integral involved in the evaluation of the capacitance of a charged plate using the Galerkin's procedure in the method of moments. The dimensions of each rectangular subsection for discretizing the conducting plate can be arbitrary. The calculated solutions converge faster than the point-matching results, as expected.	en_US
dc.language.iso	en_US	en_US
dc.subject	Galerkin's procedure	en_US
dc.subject	method of moments	en_US
dc.title	Analytical evaluation of the MoM matrix elements for the capacitance of a charged plate	en_US
dc.type	Article	en_US
dc.identifier.doi	10.1109/22.999161	en_US
dc.identifier.journal	IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES	en_US
dc.citation.volume	50	en_US
dc.citation.issue	5	en_US
dc.citation.spage	1435	en_US
dc.citation.epage	1436	en_US
dc.contributor.department	電信工程研究所	zh_TW
dc.contributor.department	Institute of Communications Engineering	en_US
dc.identifier.wosnumber	WOS:000175334700026	-
dc.citation.woscount	5	-
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