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dc.contributor.authorHsu, Chiung-Chihen_US
dc.contributor.authorHsu, Ray-Quenen_US
dc.contributor.authorWu, Yue-Hanen_US
dc.contributor.authorChi, Tung-Weien_US
dc.contributor.authorChiang, Chen-Haoen_US
dc.contributor.authorChen, Jenn-Fangen_US
dc.contributor.authorChang, Mao-Nanen_US
dc.date.accessioned2014-12-08T15:42:27Z-
dc.date.available2014-12-08T15:42:27Z-
dc.date.issued2008-10-01en_US
dc.identifier.issn0304-3991en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.ultramic.2008.04.098en_US
dc.identifier.urihttp://hdl.handle.net/11536/28831-
dc.description.abstractQuantum dots (QDs) have great potential in optical fiber communication applications were widely recognized. The structure of molecular beam epitaxy (MBE) grew InAsN QDs were investigated by transmission electron microscopy (TEM) and measured their optical properties by photoluminescence (PL). TEM images show that the InAsN QDs are irregular or oval shaped. Some of the InAsN QDs are observed to have defects, such as dislocations at or near the surface in contrast to InAs QDs, which appear to be defect free. PL results for InAsN QDs showed a red-shifted emission peak. In addition, the InAsN emission peak is broader than InAs QDs, which supports the TEM observation that the size distribution of the InAsN QDs is more random than InAs QDs. The results show that the addition of nitrogen to InAs QDs leads to a decrease in the average size of the QDs, bring changes in the QD's shape, compositional distribution, and optical properties. (C) 2008 Published by Elsevier B.V.en_US
dc.language.isoen_USen_US
dc.subjectQuantum dotsen_US
dc.subjectTEMen_US
dc.subjectPLen_US
dc.subjectMolecular beam epitaxyen_US
dc.titleAnalysis of InAsN quantum dots by transmission electron microscopy and photoluminescenceen_US
dc.typeArticle; Proceedings Paperen_US
dc.identifier.doi10.1016/j.ultramic.2008.04.098en_US
dc.identifier.journalULTRAMICROSCOPYen_US
dc.citation.volume108en_US
dc.citation.issue11en_US
dc.citation.spage1495en_US
dc.citation.epage1499en_US
dc.contributor.department機械工程學系zh_TW
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Mechanical Engineeringen_US
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.identifier.wosnumberWOS:000260518200015-
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