完整後設資料紀錄
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Tsai, CL | en_US |
dc.contributor.author | Chen, CF | en_US |
dc.contributor.author | Lin, CL | en_US |
dc.date.accessioned | 2014-12-08T15:42:39Z | - |
dc.date.available | 2014-12-08T15:42:39Z | - |
dc.date.issued | 2002-03-11 | en_US |
dc.identifier.issn | 0003-6951 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1063/1.1459109 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/28941 | - |
dc.description.abstract | Vertically well-aligned, high-aspect-ratio carbon nanotips have been directly grown upward on the gated device structure with 4 mum gate aperture. The nanotips rapidly nucleate and grow without any catalyst. In addition, selected area deposition of nanotips is achieved by using a Pt layer as inhibitor in the bias-assisted microwave plasma chemical vapor deposition. The field emission current of nanotips on the gated structure is 154 muA (at a gate-to-cathode voltage of V-gc=50 V). This results from the following reasons: (i) short gate-tips spacing, (ii) small gate aperture, and (iii) the high-aspect ratio of nanotips. (C) 2002 American Institute of Physics. | en_US |
dc.language.iso | en_US | en_US |
dc.title | Field emission from well-aligned carbon nanotips grown in a gated device structure | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1063/1.1459109 | en_US |
dc.identifier.journal | APPLIED PHYSICS LETTERS | en_US |
dc.citation.volume | 80 | en_US |
dc.citation.issue | 10 | en_US |
dc.citation.spage | 1821 | en_US |
dc.citation.epage | 1822 | en_US |
dc.contributor.department | 材料科學與工程學系 | zh_TW |
dc.contributor.department | Department of Materials Science and Engineering | en_US |
dc.identifier.wosnumber | WOS:000174181800047 | - |
dc.citation.woscount | 17 | - |
顯示於類別: | 期刊論文 |